Title :
A simplified calibration procedure for cryogenic microwave measurements
Author :
van Zyl, J.E. ; Meyer, P. ; van Niekerk, C.
Author_Institution :
Dept. of Electr. & Electron. Eng., Stellenbosch Univ., South Africa
Abstract :
A single standard co-axial two-port calibration procedure which uses only one short-circuit as a calibration standard, is presented. The technique uses time-domain reflectometry to model the embedding networks as two lossy transmission lines. It has particular significance for cryogenic measurements where cooling cycles can take up to several hours.
Keywords :
calibration; cryogenics; low-temperature techniques; microwave reflectometry; short-circuit currents; time-domain reflectometry; two-port networks; co-axial two-port calibration standard; cryogenic microwave measurement; embedding network; lossy transmission line; short-circuit; time-domain reflectometry; Cables; Calibration; Cryogenics; Electromagnetic heating; Microwave measurements; Performance evaluation; Reflection; Scattering parameters; Time domain analysis; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.512198
