Low temperature performance of COTS electronic components for Martian surface applications

Author

Tugnawat, Yogesh ; Kuhn, William

Author_Institution

Kansas State Univ., Manhattan, KS

fYear

0

fDate

0-0 0

Abstract

Commercial-off-the-shelf (COTS) components were tested over the Martian temperature range for their use in a Mars proximity microtransceiver development project. These COTS components include off-chip IF filters, off-chip TCXOs, and on-chip components such as MOSFETS, resistors and capacitors. The on-chip components are from a rad-hard silicon-on-sapphire (SOS) IC process. Novel methods were developed to reliably measure component characteristics at cryogenic temperatures. Measurements were then taken from 25degC to -120degC in steps of 20degC. The results achieved look promising and provide useful information for analog circuit designers developing circuitry for extreme low temperature ranges

Keywords

Mars; analogue integrated circuits; cryogenic electronics; integrated circuit design; space communication links; transceivers; -120 to 25 C; Mars proximity microtransceiver development project; Martian surface exploration; analog circuit design; commercial-off-the-shelf components; cryogenic temperatures; off-chip IF filters; off-chip TCXO; silicon-on-sapphire IC process; Capacitors; Cryogenics; Electronic components; Filters; MOSFETs; Mars; Radiation hardening; Resistors; Temperature distribution; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace Conference, 2006 IEEE

Conference_Location

Big Sky, MT

Print_ISBN

0-7803-9545-X

Type

conf

DOI

10.1109/AERO.2006.1655981

Filename

1655981