Title :
Automatic generation of functional coverage models from CTL
Author :
Verma, Shireesh ; Harris, Ian G. ; Ramineni, Kiran
Author_Institution :
Univ.of California, Irvine
Abstract :
Functional coverage models which measure the sufficiency of test stimuli are essential to the verification process. A key source of difficulty in their deployment emanates from the manual and imprecise nature of their development process and the lack of a sound measure of their quality. A functional coverage model can be considered complete only if it accurately reflects the behavior of the Design under Verification (DUV) as described in the specification. We present a method to automatically generate coverage models from a formal CTL description of design properties. Experimental results show that the functional coverage models generated using our technique correlate well with the detection of randomly injected errors into a design.
Keywords :
formal logic; formal specification; formal verification; trees (mathematics); CTL; automatic generation; computational tree logic; formal specification; formal verification design; functional coverage model; Art; Automatic testing; Computer science; Construction industry; Embedded computing; Feature extraction; Hardware; Industrial relations; Signal design; System testing; CTL; Coverage Model; Error Detection; Functional Verification; Simulation;
Conference_Titel :
High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International
Conference_Location :
Irvine, CA
Print_ISBN :
978-1-4244-1480-2
DOI :
10.1109/HLDVT.2007.4392806