Title :
An analysis of golden unit versus parametric testing of digital radios
Author :
Johnson, Kent K.
Author_Institution :
Cubic Corp., San Diego, CA, USA
Abstract :
Golden modems, transmitters and receivers are commonly used in production test of digital radio systems. Golden standards can provide an inexpensive reference for functional test of major subassemblies. However these simplistic custom built test fixtures often provide little insight into the performance level of the device under test, and if used improperly can lead to disastrous conclusions, particularly when bit error rates are of interest. The use of commercially available test equipment enables standards based parametric tests that are independent of any golden unit and traceable to international standards. Unfortunately parametric testing is often viewed as more expensive for complex digital modulations, leading many test professionals to choose a golden unit and a bit error rate test set as a substitute. This paper looks at the common fallacies of golden unit testing with respect to digital data links and the alternatives that are capable of providing more accurate performance characterization. This analysis, designed for the test professional, provides guidelines for the use of golden units versus parametric testing, as well as the basic physics of phase noise and nonlinearity behind choosing the appropriate test solution.
Keywords :
digital radio; error statistics; measurement standards; phase noise; production testing; telecommunication equipment testing; test equipment; DUT performance level; bit error rates; custom built test fixtures; digital data links; digital modulation; digital radio systems; functional test; golden standards; golden unit testing; modems; nonlinearity; parametric test equipment; parametric testing; phase noise; production test; receivers; traceable international standards; transmitters; Bit error rate; Digital communication; Digital modulation; Fixtures; Modems; Production systems; Radio transmitters; Receivers; System testing; Test equipment;
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
Print_ISBN :
0-7803-7837-7
DOI :
10.1109/AUTEST.2003.1243614