DocumentCode
2271647
Title
Characterization, modeling of 10-kV SiC JBS diodes and their application prospect in X-ray generators
Author
Wang, Jun ; Du, Yu ; Bhattacharya, Subhashish ; Huang, Alex Q.
Author_Institution
North Carolina State Univ., Raleigh, NC, USA
fYear
2009
fDate
20-24 Sept. 2009
Firstpage
1488
Lastpage
1493
Abstract
The 10-kV Silicon Carbide (SiC) Junction Barrier Schottky (JBS) diodes are currently being developed by a number of organizations in the United States with the aim to enable their applications in high voltage power conversions. The aim of this paper is to characterize and model the 10-kV SiC JBS diode so that their prospect and benefits in power electronic systems can be provided. Using the SPICE model of the 10-kV 5A SiC JBS diode, the advantages of 10-kV SiC JBS diodes in the application of X-ray generators were shown by PSPICE simulations for the first time. The simulation results predict that the 10-kV SiC JBS diodes based high voltage rectifiers in X-ray generators can greatly reduce the number of series diodes required and power loss than compared to the 1-kV silicon ultra fast recovery diodes based rectifiers.
Keywords
Schottky diodes; X-ray production; power semiconductor diodes; rectifiers; silicon compounds; PSPICE simulation; SiC; X-ray generators; high voltage power conversion; high voltage rectifiers; junction barrier Schottky diodes; voltage 10 kV; Junction Barrier Schottky (JBS) diode; Silicon Carbide (SiC); X-ray generator; rectifier;
fLanguage
English
Publisher
ieee
Conference_Titel
Energy Conversion Congress and Exposition, 2009. ECCE 2009. IEEE
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-2893-9
Electronic_ISBN
978-1-4244-2893-9
Type
conf
DOI
10.1109/ECCE.2009.5315963
Filename
5315963
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