• DocumentCode
    2271647
  • Title

    Characterization, modeling of 10-kV SiC JBS diodes and their application prospect in X-ray generators

  • Author

    Wang, Jun ; Du, Yu ; Bhattacharya, Subhashish ; Huang, Alex Q.

  • Author_Institution
    North Carolina State Univ., Raleigh, NC, USA
  • fYear
    2009
  • fDate
    20-24 Sept. 2009
  • Firstpage
    1488
  • Lastpage
    1493
  • Abstract
    The 10-kV Silicon Carbide (SiC) Junction Barrier Schottky (JBS) diodes are currently being developed by a number of organizations in the United States with the aim to enable their applications in high voltage power conversions. The aim of this paper is to characterize and model the 10-kV SiC JBS diode so that their prospect and benefits in power electronic systems can be provided. Using the SPICE model of the 10-kV 5A SiC JBS diode, the advantages of 10-kV SiC JBS diodes in the application of X-ray generators were shown by PSPICE simulations for the first time. The simulation results predict that the 10-kV SiC JBS diodes based high voltage rectifiers in X-ray generators can greatly reduce the number of series diodes required and power loss than compared to the 1-kV silicon ultra fast recovery diodes based rectifiers.
  • Keywords
    Schottky diodes; X-ray production; power semiconductor diodes; rectifiers; silicon compounds; PSPICE simulation; SiC; X-ray generators; high voltage power conversion; high voltage rectifiers; junction barrier Schottky diodes; voltage 10 kV; Junction Barrier Schottky (JBS) diode; Silicon Carbide (SiC); X-ray generator; rectifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition, 2009. ECCE 2009. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2893-9
  • Electronic_ISBN
    978-1-4244-2893-9
  • Type

    conf

  • DOI
    10.1109/ECCE.2009.5315963
  • Filename
    5315963