• DocumentCode
    2271706
  • Title

    Wavelet-based detection, localization, quantification and classification of short duration power quality disturbances

  • Author

    Xiangxun, Chen

  • Author_Institution
    Nat. Eng. Res. Center, Electr. Power Res. Inst., Beijing, China
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    931
  • Abstract
    This paper introduces a wavelet-based method for detecting, localizing, quantifying and classifying short duration power quality disturbances (SDPQDs). A difference signal is formed for detection and localization in real-time. Wavelet transform (WT) with a new complex wavelet is utilized to quantify SDPQDs. It can take the fast dyadic scheme not the time consuming shift-invariant scheme and just needs the detailed version at one scale not at many scales. Novel binary features are defined and extracted from time or WT domain, and then a simple binary-decimal conversion is sufficient for classification purpose. The method benefits from both speed and accuracy. Simulation results for five types of SDPQDs show that the proposed method is much better than others.
  • Keywords
    fault location; power supply quality; signal processing; wavelet transforms; binary features; binary-decimal conversion; difference signal; fast dyadic scheme; lifting scheme; shift-invariant wavelet transform; short duration power quality disturbances; wavelet transform; wavelet-based disturbance classification; wavelet-based disturbance detection; wavelet-based disturbance localization; wavelet-based disturbance quantification; Contracts; Decision making; Delay; Feature extraction; Filters; Power industry; Power quality; Power supplies; Power system simulation; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society Winter Meeting, 2002. IEEE
  • Print_ISBN
    0-7803-7322-7
  • Type

    conf

  • DOI
    10.1109/PESW.2002.985142
  • Filename
    985142