• DocumentCode
    2271899
  • Title

    Switched Ethernet testing for avionics applications

  • Author

    Bisson, Ken ; Troshynski, Troy

  • Author_Institution
    AIM-USA, E Hampstead, NH, USA
  • fYear
    2003
  • fDate
    22-25 Sept. 2003
  • Firstpage
    546
  • Lastpage
    550
  • Abstract
    Switched Ethernet is being implemented as an avionics communication architecture. A commercial standard (ARINC-664) and an aircraft vendor specific implementation known as avionics full duplex switched Ethernet (AFDX) have been developed that defines the topology and use of switched Ethernet in an avionics application. In avionics applications, the movement of data between devices must take place in a deterministic fashion and needs to be delivered very reliably. All aircraft flight hardware needs to be tested to be sure that it will communicate information properly in the switched Ethernet network. The airframe manufacturer needs to test the integrated network to verify that all flight hardware is communicating properly. Testing and maintenance testing is required to perform data communication level testing of switched Ethernet architectures for avionics applications to insure that all communication is deterministic and reliable. This paper provides an overview of a switched Ethernet avionics network and identifies the testing challenges associated with a switched Ethernet avionics application. A practical implementation performing the required tests is discussed.
  • Keywords
    aircraft testing; avionics; local area networks; telecommunication equipment testing; telecommunication network reliability; AFDX; ARINC-664 standard; aircraft flight hardware testing; avionics communication architecture; avionics full duplex switched Ethernet; communication reliability; data communication level testing; deterministic communication; switched Ethernet testing; Aerospace electronics; Aircraft; Communication switching; Ethernet networks; Hardware; Performance evaluation; Standards development; Telecommunication network reliability; Testing; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-7837-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.2003.1243630
  • Filename
    1243630