DocumentCode :
2271925
Title :
Second harmonic phase spectroscopy: frequency vs. time domain
Author :
Carriles, R. ; Wilson, P.T. ; Downer, M.C. ; Windeler, R.S.
Author_Institution :
Dept. of Phys., Texas Univ., Austin, TX, USA
fYear :
2002
fDate :
24-24 May 2002
Firstpage :
449
Abstract :
Summary form only given. We quantitatively compare conventional vs. frequency-domain interferometric second harmonic (FDISH) phase spectroscopy for the first time. A Si/SiO/sub 2//Cr MOS capacitor with applied bias -9 to 10 V provided a common sample. Since the space-charge field (SCF) changes sign at the flat-band voltage (-2.45 V), the phase of electric-field-induced SH (EFISH) shifts by /spl sim//spl pi/, providing a convenient point of comparison. FDISH phase spectra acquired in seconds, agree generally with conventional phase spectra acquired over hours. Both show strong bias-dependent phase shifts near the E/sub 1/ resonance (3.3 to 3.4 eV), where EFISH generation is resonantly enhanced, and relatively featureless, bias-independent phase for 2h/spl nu/ < 3.2 eV. However, FDISH phase shifts abruptly by /spl sim//spl pi/ at V/sub flat-band/, as expected, whereas conventionally measured phase shifts more gradually. Apparatus drifts during the longer measurement partly explain the discrepancy. In addition, screening of the SCF by photo-excited carriers selectively influences the conventional measurement, because electrons and holes separate more during its 100 fs pulse than during the FDISH 15 fs pulse, thus weakening the bias dependence. Thus, in this case, FDISH clearly yields the more accurate /spl Delta//spl psi/(/spl omega/) measurement.
Keywords :
MOS capacitors; electro-optical effects; ellipsometry; frequency-domain analysis; interference spectroscopy; optical harmonic generation; phase shifting interferometry; space charge; time-domain analysis; -9 to 10 V; 100 fs; 3.3 to 3.4 eV; Si-SiO/sub 2/-Cr; Si/SiO/sub 2//Cr MOS capacitor; applied bias; electric-field-induced SH; flat-band voltage; frequency-domain interferometric second harmonic phase spectroscopy; photo-excited carriers; space-charge field screening; strong bias-dependent phase shifts; time domain; Bandwidth; Dielectric measurements; Geometrical optics; Glass; Nonlinear optics; Phase measurement; Reflectivity; Signal generators; Solids; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
Type :
conf
DOI :
10.1109/CLEO.2002.1034189
Filename :
1034189
Link To Document :
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