• DocumentCode
    2272006
  • Title

    Routing-efficient implementation of an internal-response-based BIST architecture

  • Author

    Lien, Wei-Cheng ; Hsieh, Tong-Yu ; Lee, Kuen-Jong

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2012
  • fDate
    23-25 April 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Recently internal-response-based BIST techniques are proposed. By using internal circuit responses to directly generate test patterns, these techniques can significantly reduce or even eliminate storage requirement for test data. For these techniques, appropriate routing of the circuit internal nets to the BIST circuitry is crucial for minimizing the required area overhead and the induced performance impact. In this paper, an efficient net sharing algorithm together with special response decompressor hardware is proposed to minimize the total number of required internal nets for an internal-response-based BIST scheme. Experimental results show that on average 3.24% of nets and 2.83% area overhead of the response decompressors are sufficient to achieve complete fault coverage for ISCAS´85 circuits.
  • Keywords
    built-in self test; network routing; storage management chips; BIST architecture; internal circuit responses; response decompressors; routing-efficient implementation; storage requirement; Built-in self-test; Circuit faults; Control systems; Electrical engineering; Indexes; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation, and Test (VLSI-DAT), 2012 International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    PENDING
  • Print_ISBN
    978-1-4577-2080-2
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2012.6212622
  • Filename
    6212622