Title :
Comparison of optical BPSK and QPSK heterodyne lightwave systems
Author :
Boukli-Hacene, Mokhtar ; Kurz, Ludwik
Author_Institution :
Dept. of Electr. Eng., Polytechnic Univ., Brooklyn, NY, USA
Abstract :
A comparative study of the coherent optical binary phase shift keying (BPSK) and quadrature phase shift keying (QPSK) heterodyne communication receivers is presented. First, both receivers are analyzed assuming two systems with a 0.5 dB and 2.5 dB power penalty. The analysis is performed in terms of laser linewidth, bit rate signal power and phase error for the same bit error rate 10-10. The sensitivities of the two types of receivers are compared. Second, calculations of the signal to noise ratio (SNR) optimum, probability of bit error with cycle slippage and non-cycle slippage for both systems are presented. Finally, the comparison in terms of BER versus number of photons/bit (Epb) for different laser linewidth/bit rates and bit error rate 10-3 and 10-1 are presented. It is shown that the QPSK receiver requires a larger amount of power than the BPSK receiver to achieve the same performance. At the power penalty of 0.5 dB, the QPSK systems are impractical while the BPSK system performs well
Keywords :
demodulation; error analysis; error statistics; optical fibre communication; optical modulation; optical receivers; quadrature phase shift keying; sensitivity analysis; BPSK receiver; QPSK receiver; binary phase shift keying; bit error; bit error rate; bit rate signal power; cycle slippage; heterodyne communication receivers; laser linewidth; noncycle slippage; optical BPSK heterodyne lightwave systems; optical QPSK heterodyne lightwave system; phase error; power penalty; quadrature phase shift keying; sensitivities; signal to noise ratio; Binary phase shift keying; Bit error rate; Bit rate; Laser noise; Optical mixing; Optical receivers; Optical sensors; Quadrature phase shift keying; Signal analysis; Signal to noise ratio;
Conference_Titel :
Military Communications Conference, 1994. MILCOM '94. Conference Record, 1994 IEEE
Conference_Location :
Fort Monmouth, NJ
Print_ISBN :
0-7803-1828-5
DOI :
10.1109/MILCOM.1994.474017