• DocumentCode
    2272123
  • Title

    Timing optimization by an improved redundancy addition and removal technique

  • Author

    Entrena, Luis A. ; Espejo, José A. ; Olias, Emilio ; Uceda, Javier

  • Author_Institution
    Area de Tecnologia Electron., Univ. Carolos III de Madrid, Spain
  • fYear
    1996
  • fDate
    16-20 Sep 1996
  • Firstpage
    342
  • Lastpage
    347
  • Abstract
    Redundancy addition and removal (RAR) uses automatic test pattern generation (ATPG) techniques to identify logic optimization transforms. It has been applied successfully to combinational and sequential logic optimization and to layout driven logic synthesis for FPGAs. We present an improved RAR technique that allows to one to identify new types of optimization transforms and it is more efficient because it reduces the number of ATPG runs required. Also, we apply the RAR method to timing optimization. The experimental results show that this improved RAR technique produces significant timing optimization with very little area cost
  • Keywords
    automatic test software; field programmable gate arrays; logic CAD; logic testing; ATPG runs; FPGAs; automatic test pattern generation; improved RAR technique; layout driven logic synthesis; logic optimization transforms; optimization transforms; redundancy addition and removal technique; timing optimization; Automatic logic units; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Logic testing; Optimization methods; Redundancy; Timing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1996, with EURO-VHDL '96 and Exhibition, Proceedings EURO-DAC '96, European
  • Conference_Location
    Geneva
  • Print_ISBN
    0-8186-7573-X
  • Type

    conf

  • DOI
    10.1109/EURDAC.1996.558227
  • Filename
    558227