DocumentCode
2272123
Title
Timing optimization by an improved redundancy addition and removal technique
Author
Entrena, Luis A. ; Espejo, José A. ; Olias, Emilio ; Uceda, Javier
Author_Institution
Area de Tecnologia Electron., Univ. Carolos III de Madrid, Spain
fYear
1996
fDate
16-20 Sep 1996
Firstpage
342
Lastpage
347
Abstract
Redundancy addition and removal (RAR) uses automatic test pattern generation (ATPG) techniques to identify logic optimization transforms. It has been applied successfully to combinational and sequential logic optimization and to layout driven logic synthesis for FPGAs. We present an improved RAR technique that allows to one to identify new types of optimization transforms and it is more efficient because it reduces the number of ATPG runs required. Also, we apply the RAR method to timing optimization. The experimental results show that this improved RAR technique produces significant timing optimization with very little area cost
Keywords
automatic test software; field programmable gate arrays; logic CAD; logic testing; ATPG runs; FPGAs; automatic test pattern generation; improved RAR technique; layout driven logic synthesis; logic optimization transforms; optimization transforms; redundancy addition and removal technique; timing optimization; Automatic logic units; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Logic testing; Optimization methods; Redundancy; Timing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1996, with EURO-VHDL '96 and Exhibition, Proceedings EURO-DAC '96, European
Conference_Location
Geneva
Print_ISBN
0-8186-7573-X
Type
conf
DOI
10.1109/EURDAC.1996.558227
Filename
558227
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