Title :
Timing optimization by an improved redundancy addition and removal technique
Author :
Entrena, Luis A. ; Espejo, José A. ; Olias, Emilio ; Uceda, Javier
Author_Institution :
Area de Tecnologia Electron., Univ. Carolos III de Madrid, Spain
Abstract :
Redundancy addition and removal (RAR) uses automatic test pattern generation (ATPG) techniques to identify logic optimization transforms. It has been applied successfully to combinational and sequential logic optimization and to layout driven logic synthesis for FPGAs. We present an improved RAR technique that allows to one to identify new types of optimization transforms and it is more efficient because it reduces the number of ATPG runs required. Also, we apply the RAR method to timing optimization. The experimental results show that this improved RAR technique produces significant timing optimization with very little area cost
Keywords :
automatic test software; field programmable gate arrays; logic CAD; logic testing; ATPG runs; FPGAs; automatic test pattern generation; improved RAR technique; layout driven logic synthesis; logic optimization transforms; optimization transforms; redundancy addition and removal technique; timing optimization; Automatic logic units; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Logic testing; Optimization methods; Redundancy; Timing; Wire;
Conference_Titel :
Design Automation Conference, 1996, with EURO-VHDL '96 and Exhibition, Proceedings EURO-DAC '96, European
Conference_Location :
Geneva
Print_ISBN :
0-8186-7573-X
DOI :
10.1109/EURDAC.1996.558227