DocumentCode :
2272141
Title :
Physical design CAD in deep sub-micron era
Author :
Mitsuhashi, Takashi ; Aoki, Takahiro ; Murakata, Masami ; Yoshida, Kenji
Author_Institution :
Semicond. DA & Test Eng. Center, Toshiba Corp., Kawasaki, Japan
fYear :
1996
fDate :
16-20 Sep 1996
Firstpage :
350
Lastpage :
355
Abstract :
We investigate the impacts of miniaturization of device dimensions that causes a paradigm shift in LSI design methodology. Major design issues in deep sub micron LSIs, namely, wire delay, circuit complexity and power consumption are discussed based on scaling theory. To resolve these issues, a concept called layout driven synthesis and optimization Is introduced. Based on this concept, EDA programs including circuit optimizer, clock tree synthesis, technology mappers and so on, have been developed. Timing optimization and power minimization methods using the concept are discussed in detail. Evaluation results obtained by proposed approach show superior performance and dramatic reduction of design period, and indicate validity of layout driven synthesis and optimization concept
Keywords :
circuit layout CAD; circuit optimisation; clocks; large scale integration; trees (mathematics); EDA programs; LSI design methodology; circuit complexity; circuit optimizer; clock tree synthesis; deep sub micron LSIs; deep sub micron era; design issues; device miniaturization; layout driven synthesis; optimization concept; physical design CAD; power consumption; power minimization methods; scaling theory; technology mappers; timing optimization; wire delay; Circuit synthesis; Clocks; Complexity theory; Delay; Design automation; Design methodology; Electronic design automation and methodology; Energy consumption; Large scale integration; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1996, with EURO-VHDL '96 and Exhibition, Proceedings EURO-DAC '96, European
Conference_Location :
Geneva
Print_ISBN :
0-8186-7573-X
Type :
conf
DOI :
10.1109/EURDAC.1996.558228
Filename :
558228
Link To Document :
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