Title :
Vacuum apparatus for thermal testing of electronic equipments
Author :
Avagyan, Vardan Sh ; Danielyan, Vahe A. ; Gevorgyan, Artur A. ; Simonyan, Avetis S. ; Mkrtchyan, Tigran H. ; Vardanyan, Vahagn V.
Author_Institution :
CANDLE Synchrotron Res. Inst., Yerevan, Armenia
fDate :
June 30 2014-July 4 2014
Abstract :
In this paper is presented an apparatus for measurement of thermophysical parameters and control of quality of equipments in high vacuum also in high and low temperature conditions. The equipment gives possibility to explore the measurement dynamics depending on level of temperature and vacuum, also tightness control of joints of materials.
Keywords :
electronic equipment testing; quality control; thermal analysis; vacuum apparatus; vacuum measurement; electronic equipments; measurement dynamics; quality control; thermal testing; thermophysical parameters; tightness control; vacuum apparatus; Extraterrestrial measurements; Materials; Sensors; Sun; Temperature dependence; Temperature measurement; Vacuum technology;
Conference_Titel :
Vacuum Electron Sources Conference (IVESC), 2014 Tenth International
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4799-5770-5
DOI :
10.1109/IVESC.2014.6891944
