DocumentCode :
227219
Title :
Fluorinated fullerenes: Nanomaterials for electronic
Author :
Bakhtizin, R.Z.
Author_Institution :
Bashkir State Univ., Ufa, Russia
fYear :
2014
fDate :
June 30 2014-July 4 2014
Firstpage :
1
Lastpage :
1
Abstract :
Scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS) under ultra-high vacuum conditions have been used to study the initial stages of adsorption of fluorinated fullerene molecules C60F36 and C60F18 on Si(111)-7×7 surface. Spatially resolved images of individual C60F36 and C60F18 fluorofullerene molecules on Si(111)-7×7 surface have been obtained. The HOMO-LUMO gap of the adsorbed molecules has been estimated from spectroscopic measurements.
Keywords :
adsorption; elemental semiconductors; fullerene compounds; scanning tunnelling microscopy; scanning tunnelling spectroscopy; silicon; C60F18; C60F36; HOMO-LUMO gap; STM; Si; Si(111) surface; adsorbed molecules; fluorinated fullerene molecules; initial adsorption stages; nanomaterials; scanning tunneling microscopy; scanning tunneling spectroscopy; spatially resolved images; spectroscopic measurements; ultrahigh vacuum conditions; Adsorption; Nanomaterials; Scanning electron microscopy; Spatial resolution; Spectroscopy; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference (IVESC), 2014 Tenth International
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4799-5770-5
Type :
conf
DOI :
10.1109/IVESC.2014.6891946
Filename :
6891946
Link To Document :
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