Title :
μiTRON customization for use in automated test equipment
Author :
Srinivas, N.S. ; Shankaran, Satyanath
Author_Institution :
Wipro Technol., Bangalore, India
Abstract :
Automated test equipment (ATE) plays an important role in manufacturing and testing of devices and systems. The complexity of the test equipment increases as new devices with increasing complexity are introduced. For the manufacturer of ATE, it is important that the new requirements of testing are met by simplifying the implementation of ATE itself. In this context, it is necessary that the ATE has a scalable operating system that can be stretched to fulfill complex testing needs incrementally. μiTRON has all the necessary features that can address these needs. μiTRON provides a broad frame work from which a customized version to address a specific market segment can be easily developed. μiTRON provides rich set of features that can be used for testing of complex devices or systems. This paper discusses the important requirements of an ATE and how μiTRON can be developed and customized to meet the requirements. Two different scenarios are discussed: a) customization of μiTRON for use in a test equipment; and b) automatic configuration of μiTRON for use on target unit to be tested.
Keywords :
automatic test equipment; automatic test software; configuration management; operating systems (computers); μiTRON real time operating system; automated test equipment; automatic configuration; scalable ATE operating system; test equipment customization; Automatic testing; Computer interfaces; Graphical user interfaces; Instruments; Kernel; Manufacturing automation; Middleware; Operating systems; System testing; Test equipment;
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
Print_ISBN :
0-7803-7837-7
DOI :
10.1109/AUTEST.2003.1243654