• DocumentCode
    2272586
  • Title

    Study on the reliability of high power device assemblies using high-Pb solder alternatives: an overview

  • Author

    Caers, J.F.J.M. ; Zhao, X.J. ; Eggink, H.J.

  • Author_Institution
    Philips Appl. Technol., Eindhoven, Netherlands
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    342
  • Lastpage
    349
  • Abstract
    This paper gives a comprehensive overview of literature data on the reliability of different alternative Pb-free assembly technologies for high temperature applications with 4 groups of materials: SAC based solder alloys, Silver filled epoxies, Eutectic AuSn solder and a thermal interface material. For each group, the typical degradation models and mechanism of different material compositions in the high temperature applications will be overviewed, and accelerated test results with different test modules will be summarized. Approaches to predict the expected damage in the field, developed and being developed accelerated life models for certain type of applications will be given as well. In addition, the potential and the challenges to switch to these high Pb alternatives and to predict their reliability will be discussed. This overview provides guidance to potential users of assemblies for high power applications for selecting a proper reliable Pb-free alternative assembly method.
  • Keywords
    assembling; reliability; solders; assembly technologies; high power device assemblies; reliability; solder alternatives; Assembly; Creep; Metals; Reliability; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582345
  • Filename
    5582345