Investigation of the detection efficiency of polycrystalline diamond detectors with a heavy ion microprobe

Author

Schloegl, M. ; Fischer, B.E.

Author_Institution

Gesellschaft fur Schwerionenforschung mbH, Darmstadt, Germany

fYear

1999

fDate

1999

Firstpage

132

Lastpage

135

Abstract

The influence of the crystal structure of chemical vapour deposition (CVD) diamonds on their charge collection efficiency has been investigated by using a heavy ion microprobe with C ions of 5.9 MeV/u. Charge collection maps and pulse-height spectra are discussed. A comparison of the charge collection maps with the corresponding secondary electron image shows that not only the grain boundaries are responsible for the poor charge collection efficiency, but also the single CVD diamond crystal is trapping a significant part of the generated charge

Keywords

CVD coatings; diamond; semiconductor counters; C; charge collection efficiency; charge trapping; chemical vapour deposition; crystal structure; grain boundary; heavy ion microprobe; polycrystalline diamond detector; pulse height spectra; secondary electron imaging; Charge carrier mobility; Chemical vapor deposition; Crystalline materials; Crystals; Dosimetry; Electron traps; Grain boundaries; Pulse measurements; Radiation detectors; Topology;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on

Conference_Location

Fontevraud

Print_ISBN

0-7803-5726-4

Type

conf

DOI

10.1109/RADECS.1999.858561

Filename

858561