DocumentCode :
2272783
Title :
Modeling of low frequency noise sources in HEMTs
Author :
Felgentreff, T. ; Olbrich, G.R.
Author_Institution :
Inst. fur Hochfrequenztech., Tech. Univ. Munchen, Germany
Volume :
3
fYear :
1996
fDate :
17-21 June 1996
Firstpage :
1743
Abstract :
For amplifier and oscillator applications it is often necessary, to know the low frequency noise behavior of the used HEMT device. In this paper we present the models of two important low frequency noise contributions-the f/sup -/spl alpha// noise and the generation/recombination noise (g-r noise). Starting with measurements of the noise power spectral densities at about 100 bias points we can find analytical expressions for the characterization of two noise current sources assumed in the channel of the HEMT. The two low frequency noise current sources are implemented in a large signal physics based HEMT model, which describes the signal and noise properties in the frequency range from 1 Hz to 40 GHz and is used for oscillator phase noise calculations. Also other noise current sources in this model will be discussed.
Keywords :
high electron mobility transistors; microwave field effect transistors; semiconductor device models; semiconductor device noise; 1 Hz to 40 GHz; HEMT; f/sup -/spl alpha// noise; generation/recombination noise; large signal model; low frequency noise; noise current sources; noise power spectral density; oscillator phase noise; Current measurement; Density measurement; HEMTs; Low-frequency noise; Low-noise amplifiers; MODFETs; Noise generators; Oscillators; Phase noise; Power measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3246-6
Type :
conf
DOI :
10.1109/MWSYM.1996.512279
Filename :
512279
Link To Document :
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