• DocumentCode
    227286
  • Title

    Technological waves and future perspectives of vacuum electronics

  • Author

    Gaertner, Georg

  • Author_Institution
    Philips Res. Labs. Aachen, Aachen, Germany
  • fYear
    2014
  • fDate
    June 30 2014-July 4 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Vacuum electronics (VE) have been one of the motors of industrial growth in the last 130 years. The development of VE concepts has been pushed by several technological waves/cycles, starting with incandescent lamps, continuing with the radio tube era then followed by the cathode ray tubes. Before and during these cycles also the enabling technologies for VE, especially vacuum technology and cathode technology, have been developed further improved continously. Despite the decay of the first 3 waves, vacuum electronics is still alive in the form of microwave tubes, X-ray tubes and other applications. In the case of microwave tubes their specific advantages in the high power/high frequency domain over solid state is discussed. This could open new perspectives for future applications in IC design. In this talk first the different technological waves are described and then the progress of the two main enabling technologies is elucidated, monitored by decreasing vacuum base pressure and increasing cathode emission capabilities. Finally future perspectives for VE are given.
  • Keywords
    X-ray tubes; cathode-ray tubes; microwave tubes; vacuum microelectronics; X-ray tubes; cathode emission; cathode ray tubes; cathode technology; high power-high frequency domain; incandescent lamps; microwave tubes; radio tube era; solid state; technological waves-cycles; vacuum base pressure; vacuum electronics; vacuum technology; Cathode ray tubes; Cathodes; Electron tubes; Microwave FET integrated circuits; Microwave integrated circuits; Microwave technology; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference (IVESC), 2014 Tenth International
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    978-1-4799-5770-5
  • Type

    conf

  • DOI
    10.1109/IVESC.2014.6891984
  • Filename
    6891984