Proton-induced single event upset characterization of a 1 Giga-sample per second analog to digital converter

Author

Reed, R.A. ; Marshall, P.W. ; Carts, M.A. ; Henegar, G.L. ; Katz, R.B.

Author_Institution

NASA Goddard Space Flight Center, Greenbelt, MD, USA

fYear

1999

fDate

1999

Firstpage

188

Lastpage

192

Abstract

Some high-speed space-borne data acquisition and dissemination systems require conversion of an analog data signal into a digital signal for on-board digital processing. The NASA Geoscience Laser Altimeter System (GLAS) is one such instrument. It uses the Signal Processing Technologies SPT7760 to convert an analog signal from the laser altimeter. The analog data is converted by the SPT7760 at 1 Giga-sample per second (Gsps). These types of data handling applications can typically withstand a relatively high bit error ratio (BER). In this paper, we describe the a novel approach for proton-induced single event upset characterization of the SPT760. Data is given for operating sample rates from 125 Msps to 1 Gsps

Keywords

analogue-digital conversion; proton effects; space vehicle electronics; GLAS; SPT7760; analog-to-digital converter; bit error ratio; digital signal processing; high-speed data acquisition; laser altimeter; proton induced single event upset; space instrumentation; Analog-digital conversion; Clocks; Data acquisition; Instruments; Manufacturing; NASA; Power lasers; Signal processing; Single event upset; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on

Conference_Location

Fontevraud

Print_ISBN

0-7803-5726-4

Type

conf

DOI

10.1109/RADECS.1999.858575

Filename

858575