Application of a pulsed laser for evaluation and optimization of SEU-hard designs

Author

McMorrow, Dale ; Melinger, Joseph S. ; Buchner, Stephen ; Scott, Thomas ; Brown, Ronald D. ; Haddad, Nadim F.

Author_Institution

Naval Res. Lab., Washington, DC, USA

fYear

1999

fDate

1999

Firstpage

198

Lastpage

204

Abstract

Pulsed laser single-event upset test are used to pinpoint and characterize sensitive nodes of circuits and to provide feedback relevant to the development and optimization of radiation-hard designs. The results presented reveal the advantages of incorporating laser evaluation at an early stage into programs designed for the development of radiation-hardened parts. A quantitative correlation is observed between the laser single-event upset and single-event latchup threshold measurements and those performed using accelerator-based heavy ion testing methods

Keywords

integrated circuit testing; laser beam effects; radiation hardening (electronics); SEU-hard designs; accelerator-based heavy ion testing methods; circuits; feedback; pulsed laser; radiation-hard designs; radiation-hardened parts; sensitive nodes; single-event latchup threshold measurements; single-event upset test; Circuit testing; Design optimization; Laboratories; Laser feedback; Laser mode locking; Optical design; Optical pulses; Performance evaluation; Pulse circuits; Pulse measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on

Conference_Location

Fontevraud

Print_ISBN

0-7803-5726-4

Type

conf

DOI

10.1109/RADECS.1999.858580

Filename

858580