• DocumentCode
    2273101
  • Title

    Software defect prediction using Two level data pre-processing

  • Author

    Verma, Rajesh ; Gupta, Arpan

  • Author_Institution
    Comput. Sci. Eng., PDPM IIITDM, Jabalpur, India
  • fYear
    2012
  • fDate
    25-27 April 2012
  • Firstpage
    311
  • Lastpage
    317
  • Abstract
    Defect prediction can be useful to streamline testing efforts and reduce the development cost of software. Predicting defects is usually done by using certain data mining and machine learning techniques. A prediction model is said to be effective if it is able to classify defective and non defective modules accurately. In this paper we investigate the result of data pre-processing on the performance of four different K-NN classifiers and compare the results with random forest classifier. The method used for pre-processing includes attribute selection and instance filtering. We observed that Two-level data pre-processing enhances defect prediction results. We also report how these two filters influence the performance independently. The observed performance improvement can be attributed to the removal of irrelevant attributes by dimension (attribute) reduction and of class imbalance problem by Resampling, together leading to the improved performance capabilities of the classifiers.
  • Keywords
    data mining; learning (artificial intelligence); pattern classification; software reliability; K-NN classifiers; attribute selection; class imbalance problem; data mining; dimension reduction; instance filtering; machine learning techniques; nondefective module classification; random forest classifier; software defect prediction model; software development cost reduction; streamline testing efforts; two level data preprocessing; Accuracy; Filtering; Handheld computers; Predictive models; Radio frequency; Software; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Recent Advances in Computing and Software Systems (RACSS), 2012 International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4673-0252-4
  • Type

    conf

  • DOI
    10.1109/RACSS.2012.6212686
  • Filename
    6212686