Title :
Mathematical foundations of information processing methods dielectric spectroscopy of thin films
Author :
Karpov, A.G. ; Klemeshev, Vladimir A. ; Trofimov, Vasily V.
Author_Institution :
St.-Petersburg State Univ., St. Petersburg, Russia
fDate :
June 30 2014-July 4 2014
Abstract :
The system of real-time dielectric spectroscopy was elaborated. The mathematical model for determining the optical properties of thin films on a transparent substrate was developed. The study of the optical properties of thin films efficient emitters of interest in practical applications was performed.
Keywords :
spectroscopy; thin films; transparency; information processing methods; mathematical foundation; real time dielectric spectroscopy; thin films; transparent substrate; Adaptive optics; Dielectrics; Optical refraction; Permittivity; Real-time systems; Spectroscopy; Stimulated emission;
Conference_Titel :
Vacuum Electron Sources Conference (IVESC), 2014 Tenth International
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4799-5770-5
DOI :
10.1109/IVESC.2014.6892005
