DocumentCode
227329
Title
Mathematical foundations of information processing methods dielectric spectroscopy of thin films
Author
Karpov, A.G. ; Klemeshev, Vladimir A. ; Trofimov, Vasily V.
Author_Institution
St.-Petersburg State Univ., St. Petersburg, Russia
fYear
2014
fDate
June 30 2014-July 4 2014
Firstpage
1
Lastpage
2
Abstract
The system of real-time dielectric spectroscopy was elaborated. The mathematical model for determining the optical properties of thin films on a transparent substrate was developed. The study of the optical properties of thin films efficient emitters of interest in practical applications was performed.
Keywords
spectroscopy; thin films; transparency; information processing methods; mathematical foundation; real time dielectric spectroscopy; thin films; transparent substrate; Adaptive optics; Dielectrics; Optical refraction; Permittivity; Real-time systems; Spectroscopy; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference (IVESC), 2014 Tenth International
Conference_Location
St. Petersburg
Print_ISBN
978-1-4799-5770-5
Type
conf
DOI
10.1109/IVESC.2014.6892005
Filename
6892005
Link To Document