DocumentCode :
2273558
Title :
2.0mils au wire wedge bonding process characterization to eliminate lift bond on accelerometer device
Author :
ZhiJie, Wang ; Zhigang, Bai ; Lee, Ben ; Choi, H.S. ; Kwang, K.S.
fYear :
2010
fDate :
16-19 Aug. 2010
Firstpage :
382
Lastpage :
387
Abstract :
Au wire thermosonic wedge bonding is applied for die to die interconnect on accelerometer device as traditional Al thermo-compression wedge bonding is not suitable for this application due to the constraint of fine pitch silicon bond pad and fragile bond pad structure of MEMS devices. With thermosonic wedge bonding, a few of lifted (wedge) bonds were reported during end customer application, the lifted bond causes malfunction of the device. The methods employed during wedge bond failure study provide an effective and systematic approach on root cause exploration, the characterized wedge bond process effectively eliminates wedge bond lift bond incident and guarantees the smoothness and health of mass production.
Keywords :
accelerometers; failure analysis; fine-pitch technology; integrated circuit interconnections; mass production; microassembling; micromechanical devices; tape automated bonding; Au; MEMS devices; accelerometer device; characterized wedge bond process; die to die interconnect; end customer application; fine pitch silicon bond pad; fragile bond pad structure; lifted bonds; mass production; root cause exploration; thermo-compression wedge bonding; wedge bond failure study; wedge bond lift bond incident; wire thermosonic wedge bonding; wire wedge bonding process characterization; Bonding; Cavity resonators; Force; Heating; Indexes; Lead; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-8140-8
Type :
conf
DOI :
10.1109/ICEPT.2010.5582392
Filename :
5582392
Link To Document :
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