Title :
Components off the shelf selection for nuclear industry environment greater than 100 kGy(Si)
Author :
Saussine, J.D. ; Hamonic, D. ; Feuilloley, E. ; Feuillatre, O.
Author_Institution :
Thomson-CSF, Elancourt, France
Abstract :
This paper presents total dose test results of Components Off The Shelf (COTS), greater than 100 kGy(Si), for nuclear industry applications. Tested components are bipolar analog integrated circuits (operational amplifiers, regulators) and bipolar logic integrated circuits (TTL-LS and ECL technologies)
Keywords :
bipolar analogue integrated circuits; nuclear electronics; operational amplifiers; radiation effects; radiation hardening (electronics); 100 kGy; bipolar analog integrated circuits; bipolar logic integrated circuits; components; nuclear industry environment; off the shelf selection; operational amplifiers; regulators; total dose test results; Analog integrated circuits; Bipolar integrated circuits; Circuit testing; Industry applications; Integrated circuit technology; Integrated circuit testing; Logic circuits; Logic testing; Operational amplifiers; Regulators;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location :
Fontevraud
Print_ISBN :
0-7803-5726-4
DOI :
10.1109/RADECS.1999.858619
