Title :
Recent advances in IEEE standards for diagnosis and diagnostic maturation
Author :
Sheppard, John W. ; Wilmering, Timothy J.
Author_Institution :
Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD
Abstract :
Efforts by the Department of Defense to increase use of commercial or dual-use technologies have resulted in the levying of new requirements on automatic test systems. One of the areas where requirements are being levied is in the exchange of diagnostic and maintenance information. These requirements have led to the creation or revision of several IEEE standards intended to support such information exchange. In this paper, we explain the nature of the revisions being made to IEEE STD 1232 (AI-ESTATE). We also explain the nature of the information being modeled for IEEE PI636 (SIMICA) and its relationship to AI-E STATE. Finally, we provide a discussion of a new XML-based exchange format being incorporated into AI-ESTATE, SIMICA, and related standards to satisfy exchange requirements under the DoD and industry-led automatic test markup language (ATML) initiative and explain the role of AI-ESTATE and SIMICA within the larger scope of ATML
Keywords :
IEEE standards; XML; aerospace computing; aerospace testing; automatic test equipment; automatic test software; AI-ESTATE; IEEE PI636; IEEE STD 1232; IEEE standards; SIMICA; XML exchange format; automatic test markup language; automatic test systems; diagnosis maturation; diagnostic maturation; information exchange; Automatic testing; Bayesian methods; Electronic equipment testing; Industrial relations; Markup languages; Random variables; Software standards; Standards development; Standards publication; System testing;
Conference_Titel :
Aerospace Conference, 2006 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
0-7803-9545-X
DOI :
10.1109/AERO.2006.1656107
