DocumentCode :
2273754
Title :
An Electronic Tongue System Design Using Ion Sensitive Field Effect Transistors and Their Interfacing Circuit Techniques
Author :
Chung, Wen-Yaw ; Chang, Kuo-Chung ; Hong, Da-You ; Cheng, Cheanyeh ; Cruza, Febus ; Liu, Tai Sung ; Pijanowska, Dorota G. ; Dawgul, Marek ; Torbicz, Wladyslaw ; Yang, Chung Huang ; Grabiec, Pitor B. ; Jarosewicz, Bohdan ; Chiang, Jung-Lung
Author_Institution :
Electron. Eng. Depts., Chung-Yuan Christian Univ., Chungli
fYear :
2008
fDate :
13-16 July 2008
Firstpage :
44
Lastpage :
48
Abstract :
This paper proposes an electronic tongue system design using ion sensitive field effect transistors (ISFETs), extended-gate FET (EGFET) and their interfacing circuit techniques. Bridge-type constant voltage, constant current, and temperature compensation circuitries have all been developed for ISFET to sense hydrogen and chloride ions for water quality monitoring applications. This design offers a sensitivity of over 54 mV/pH and an improved temperature coefficient (T.C.) of 0.02 mV/degC; in addition, a sensitivity of 43 mV/pCl can be achieved by using a proposed extended-gate FET with a mixed polyvinyl chloride (PVC), chloride ionophore III (ETH9033) and lipophylic salt on the indium-tin-oxide (ITO)/glass substrate.
Keywords :
chlorine compounds; electrochemical sensors; glass; hydrogen; indium compounds; ion sensitive field effect transistors; ISFET; ITO; bridge-type constant voltage circuitries; chloride ionophore III; chloride ions; constant current circuitries; electronic tongue system; extended-gate FET; glass substrate; hydrogen ions; interfacing circuit techniques; ion sensitive field effect transistors; lipophylic salt; polyvinyl chloride; temperature compensation circuitries; water quality monitoring; Biomedical engineering; Biomembranes; Cities and towns; Design engineering; FETs; MOSFET circuits; Sensor phenomena and characterization; Sensor systems; Temperature sensors; Tongue;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
University/Government/Industry Micro/Nano Symposium, 2008. UGIM 2008. 17th Biennial
Conference_Location :
Louisville, KY
Print_ISBN :
978-1-4244-2484-9
Electronic_ISBN :
978-1-4244-2485-6
Type :
conf
DOI :
10.1109/UGIM.2008.19
Filename :
4573197
Link To Document :
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