Title :
Manufacturing test technologies for commercial GaAs RF/microwave integrated circuits
Author :
Ersland, P. ; Cousineau, S. ; Mahon, J. ; Lanteri, J.-P.
Author_Institution :
Microelectron Div., M/A-COM, Lowell, MA, USA
Abstract :
The unique requirements of a production test for commercial RF/microwave IC products are described. As product cost is one of the most significant discriminators in this marketplace, techniques for minimizing the impact of test on product cost are discussed, including test system hardware, software, test plans and automated device handling. To further illustrate the impact of these techniques an example of production test for a plastic packaged single pole double throw (SPDT) switch is presented.
Keywords :
III-VI semiconductors; MMIC; antenna accessories; automatic test equipment; cellular radio; economics; gallium arsenide; integrated circuit manufacture; integrated circuit testing; land mobile radio; plastic packaging; semiconductor device packaging; semiconductor switches; telecommunication equipment testing; transceivers; GaAs; automated device handling; commercial GaAs RF integrated circuits; commercial GaAs microwave integrated circuit; manufacturing test technologies; minimization; plastic packaged single pole double throw switch; product cost; production test; software; test plans; test system hardware; Automatic testing; Costs; Gallium arsenide; Manufacturing; Microwave technology; Production; Radio frequency; Software testing; Switches; System testing;
Conference_Titel :
Technologies for Wireless Applications Digest, 1995., MTT-S Symposium on
Conference_Location :
Vancouver, BC, Canada
Print_ISBN :
0-7803-1982-6
DOI :
10.1109/MTTTWA.1995.512333
