Title :
Total dose and heavy ion evaluation of a hardened RISC microcontroller
Author :
Feuilloley, Eric ; Hamonic, Didier ; Cayron, Stéphane ; Dubocquet, Etienne ; Jeannin, Philippe ; Bezerra, Françoise
Author_Institution :
Thomson-CSF, Trappes, France
Abstract :
This paper presents an evaluation methodology of the total dose and heavy ion response based on utilising the integrated test resources of the IEEE 1149.1 (JTAG) standard. The FLAME microcontroller (compatible with the SPARCTM V8 architecture), fabricated in the Honeywell SSEC SOI RICMOSTM IV technology, is used to validate the method
Keywords :
CMOS digital integrated circuits; integrated circuit testing; ion beam effects; microcontrollers; radiation hardening (electronics); reduced instruction set computing; silicon-on-insulator; FLAME microcontroller; Honeywell SSEC SOI RICMOS IV technology; IEEE 1149.1 standard; JTAG; SPARC V8 architecture; Si; evaluation methodology; hardened RISC microcontroller; heavy ion evaluation; integrated test resources; total dose evaluation; Built-in self-test; Circuit testing; Content addressable storage; Digital TV; Electronics packaging; Emulation; Fires; Reduced instruction set computing; System testing; Temperature;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location :
Fontevraud
Print_ISBN :
0-7803-5726-4
DOI :
10.1109/RADECS.1999.858639
