Total dose and heavy ion evaluation of a hardened RISC microcontroller

Author

Feuilloley, Eric ; Hamonic, Didier ; Cayron, Stéphane ; Dubocquet, Etienne ; Jeannin, Philippe ; Bezerra, Françoise

Author_Institution

Thomson-CSF, Trappes, France

fYear

1999

fDate

1999

Firstpage

542

Lastpage

547

Abstract

This paper presents an evaluation methodology of the total dose and heavy ion response based on utilising the integrated test resources of the IEEE 1149.1 (JTAG) standard. The FLAME microcontroller (compatible with the SPARC^TM V8 architecture), fabricated in the Honeywell SSEC SOI RICMOS^TM IV technology, is used to validate the method

Keywords

CMOS digital integrated circuits; integrated circuit testing; ion beam effects; microcontrollers; radiation hardening (electronics); reduced instruction set computing; silicon-on-insulator; FLAME microcontroller; Honeywell SSEC SOI RICMOS IV technology; IEEE 1149.1 standard; JTAG; SPARC V8 architecture; Si; evaluation methodology; hardened RISC microcontroller; heavy ion evaluation; integrated test resources; total dose evaluation; Built-in self-test; Circuit testing; Content addressable storage; Digital TV; Electronics packaging; Emulation; Fires; Reduced instruction set computing; System testing; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on

Conference_Location

Fontevraud

Print_ISBN

0-7803-5726-4

Type

conf

DOI

10.1109/RADECS.1999.858639

Filename

858639