Title :
A board-level prognostic monitor for MOSFET TDDB
Author :
Goodman, D. ; Vermeire, B. ; Ralston-Good, J. ; Graves, R.
Author_Institution :
Ridgetop Group, Inc., Tucson, AZ
Abstract :
A prognostic cell to monitor time-dependent dielectric breakdown and electronic aging of integrated circuits has been designed and fabricated
Keywords :
MOSFET; MOSFET circuits; electric breakdown; MOSFET TDDB; board-level prognostic monitor; electronic aging; integrated circuits; prognostic cell; time-dependent dielectric breakdown; Aging; Biographies; Condition monitoring; Degradation; Dielectric breakdown; Integrated circuit reliability; MOSFET circuits; Maintenance; Stress; Voltage;
Conference_Titel :
Aerospace Conference, 2006 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
0-7803-9545-X
DOI :
10.1109/AERO.2006.1656127
