Title :
Comparison between ground tests and flight data for two static 32 KB memories
Author :
Cheynet, Ph. ; Valazco, R. ; Ecoffet, R. ; Duzellier, S. ; David, J.P. ; Loquet, J.G.
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
The microelectronics and photonics testbed (MPTB) carrying twenty-four experiments on-board a scientific satellite has been in a high radiation orbit since November 1997. This paper presents single event Upset flight results on two commercial static RAMs includes in two of the MPTB experiments
Keywords :
SRAM chips; automatic testing; integrated circuit testing; radiation effects; space vehicle electronics; 32 KB; SEU flight results; SRAM; commercial static RAMs; flight data; ground tests; high radiation orbit; scientific satellite; single event upset; static memory chips; Circuits; Microelectronics; PROM; Photonics; Random access memory; Satellites; Single event upset; Telecommunications; Telemetry; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location :
Fontevraud
Print_ISBN :
0-7803-5726-4
DOI :
10.1109/RADECS.1999.858646
