Single event transient characterisation of analog IC´s for ESA´s satellites

Author

Harboe-Sorensen, R. ; Guerre, F.-X. ; Constans, H. ; van Dooren, J. ; Berger, G. ; Hajdas, W.

Author_Institution

Eur. Space Agency, Eur. Space Res. & Technol. Centre, Noordwijk, Netherlands

fYear

1999

fDate

1999

Firstpage

573

Lastpage

581

Abstract

The analysis of four self switch-off events in the power supply on-board ESA´s SOHO satellite point strongly in the direction of being cosmic ray or proton induced. Detailed analysis of the relevant power supply schematics identified a number of analog IC´s capable of causing or contributing to such events. This paper details the effort taken in order to characterise the upset sensitivity of the various analog IC´s flown. Testing aspects and Single Event Transient (SET) results are presented. Ground testing, simulating the flight conditions, were carried out at both heavy ion and proton accelerators

Keywords

analogue integrated circuits; artificial satellites; integrated circuit testing; ion beam effects; proton effects; sensitivity; space vehicle electronics; transient analysis; ESA satellites; SET characterisation; SOHO satellite; analog ICs; cosmic ray induced events; flight conditions simulation; ground testing; heavy ion testing; onboard power supply; proton induced events; self switch-off events; single event transient characterisation; upset sensitivity; Analog integrated circuits; Circuit testing; Operational amplifiers; Power supplies; Proton accelerators; Pulse width modulation; Satellites; Single event upset; System testing; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on

Conference_Location

Fontevraud

Print_ISBN

0-7803-5726-4

Type

conf

DOI

10.1109/RADECS.1999.858650

Filename

858650