Effect of the preparation method on the optical properties of GeS1.2 — AgI films

Author

Petkov, Petko ; Ilcheva, V. ; Boev, V. ; Petkova, T. ; Mihailescu, I. ; Popescu-Pelin, G. ; Ristoscu, C.

Author_Institution

Dept. of Phys., Univ. of Chem. Technol. & Metall., Sofia, Bulgaria

fYear

2014

fDate

June 30 2014-July 4 2014

Firstpage

1

Lastpage

1

Abstract

Thin films from Ge-S-AgI system with various amount of AgI prepared by pulsed laser deposition and vacuum thermal evaporation method have been studied. The films are analysed with respect to their morphology, structure and roughness. The optical properties are investigated as a function of the composition and preparation method.

Keywords

absorption coefficients; chalcogenide glasses; germanium compounds; pulsed laser deposition; refractive index; semiconductor thin films; silver compounds; spin coating; surface roughness; ultraviolet spectra; vacuum deposition; visible spectra; (GeS_1.2)_1-x-(AgI)_x; absorption edge; film morphology; film roughness; film structure; optical properties; preparation method; pulsed laser deposition; reflection spectra; refractive index; thin films; transmission spectra; vacuum thermal evaporation method; Biomedical optical imaging; Materials; Optical device fabrication; Optical polarization; Optical refraction; Optical variables control; Pulsed laser deposition;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electron Sources Conference (IVESC), 2014 Tenth International

Conference_Location

St. Petersburg

Print_ISBN

978-1-4799-5770-5

Type

conf

DOI

10.1109/IVESC.2014.6892056

Filename

6892056