Title :
CMOS ASIC devices for the measurement of short time intervals
Author :
Rahkonen, Timo ; Kostamovaara, Juha ; Säynäjäkangas, Seppo
Author_Institution :
Dept. of Electr. Eng., Oulu Univ., Finland
Abstract :
Two time-to-digital converters are designed, with special emphasis on searching for and modeling the causes of timing jitter in CMOS devices. The time base is formed by an external high-frequency three-phase clock in the first design and by tapped on-chip delay-lines in the second circuit. The single-shot resolutions of the circuits are about 7 and 0.5 ns.<>
Keywords :
CMOS integrated circuits; analogue-digital conversion; application specific integrated circuits; time bases; time measurement; 0.5 ns; 7 ns; CMOS ASIC devices; measurement of short time intervals; single-shot resolutions; tapped on-chip delay-lines; three-phase clock; time-to-digital converters; timing jitter; Application specific integrated circuits; CMOS logic circuits; Circuit testing; Delay effects; Frequency; Jitter; Propagation delay; Temperature dependence; Time measurement; Voltage;
Conference_Titel :
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location :
Espoo, Finland
DOI :
10.1109/ISCAS.1988.15237
