DocumentCode
2274366
Title
CMOS ASIC devices for the measurement of short time intervals
Author
Rahkonen, Timo ; Kostamovaara, Juha ; Säynäjäkangas, Seppo
Author_Institution
Dept. of Electr. Eng., Oulu Univ., Finland
fYear
1988
fDate
7-9 June 1988
Firstpage
1593
Abstract
Two time-to-digital converters are designed, with special emphasis on searching for and modeling the causes of timing jitter in CMOS devices. The time base is formed by an external high-frequency three-phase clock in the first design and by tapped on-chip delay-lines in the second circuit. The single-shot resolutions of the circuits are about 7 and 0.5 ns.<>
Keywords
CMOS integrated circuits; analogue-digital conversion; application specific integrated circuits; time bases; time measurement; 0.5 ns; 7 ns; CMOS ASIC devices; measurement of short time intervals; single-shot resolutions; tapped on-chip delay-lines; three-phase clock; time-to-digital converters; timing jitter; Application specific integrated circuits; CMOS logic circuits; Circuit testing; Delay effects; Frequency; Jitter; Propagation delay; Temperature dependence; Time measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location
Espoo, Finland
Type
conf
DOI
10.1109/ISCAS.1988.15237
Filename
15237
Link To Document