• DocumentCode
    2274516
  • Title

    Modeling a Monolithic Comb Drive for Large-Deflection Multi-DOF Microtransduction

  • Author

    Clark, J.V.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
  • fYear
    2008
  • fDate
    13-16 July 2008
  • Firstpage
    203
  • Lastpage
    207
  • Abstract
    To help extend the investigation and exploitation of nanoscale phenomena, there is a need for high precision, large deflection microtransducers with multiple degrees of freedom (DOF). In this paper, we investigate the predicted performance of such a large deflection microtransducer using finite element analysis. To sense and actuate in three dimensions, we use three types of comb drives: a vertical comb drive, a planar comb drive, and a novel planar monolithic comb drive, which operates as an in-situ RC circuit. The two planar comb drives are used to translate a proof mass with independent in-plane x- and y- directions, and the vertical comb drive translates the proof mass in the out-of-plane z-direction. The device resists rotation about the z axis. We address precise sensing and actuation by using high-precision capacitance and voltage to detect position and to apply force, respectively. We explore design issues such as geometry and material properties, and we characterize the monolithic comb drive. We limit the geometry of the transducer to one structural layer, which is amenable to a simple one-mask fabrication process such as silicon-on-insulator (SOI).
  • Keywords
    actuators; finite element analysis; masks; nanopositioning; silicon-on-insulator; transducers; Si; degrees of freedom; finite element analysis; monolithic comb drive; multi-DOF microtransduction; silicon-on-insulator; Capacitance; Circuits; Fabrication; Finite element methods; Geometry; Material properties; Performance analysis; Resists; Transducers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Micro/Nano Symposium, 2008. UGIM 2008. 17th Biennial
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    978-1-4244-2484-9
  • Electronic_ISBN
    978-1-4244-2485-6
  • Type

    conf

  • DOI
    10.1109/UGIM.2008.60
  • Filename
    4573238