DocumentCode :
2274659
Title :
Interfacial reaction and melting/solidification characteristics between Sn and different metallizations of Cu, Ag, Ni and Co
Author :
Zhou Min-Bo ; Qin Hong-Bo ; Ma Xiao ; Zhang Xin-Ping
Author_Institution :
Sch. of Mater. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
fYear :
2010
fDate :
16-19 Aug. 2010
Firstpage :
202
Lastpage :
207
Abstract :
The interfacial reaction between pure Sn and different metallizations of Cu, Ag, Ni and Co, as well as the melting/solidification characteristics of each reaction system were investigated using a differential scanning calorimeter (DSC). Results show that there exists the early interfacial eutectic reaction in Sn/Cu and Sn/Ag systems, which leads to the occurrence of the Sn melting at the interface at a temperature 4.9°C (for Sn/Cu system) and 10.6°C (for Sn/Ag system) lower than the actual melting point of pure Sn (231.9°C), and consequently both of Sn/Cu and Sn/Ag soldering systems exhibit scallop-like morphology of intermetallic compound (IMC). Although there was the diffusion of Ni and Co atoms into pure Sn, no obvious change in the melting temperature of Sn/Ni and Sn/Co soldering systems, compared to the melting point of pure Sn, was observed, and the interfacial morphologies of Sn/Ni and Sn/Co systems showed platelet-like IMC. In addition, it has been shown that the undercooling values of Sn/Ni and Sn/Co systems are much smaller than that of Sn/Cu and Sn/Ag ones.
Keywords :
cobalt alloys; copper alloys; differential scanning calorimetry; eutectic alloys; melting; nickel alloys; silver alloys; solidification; tin alloys; Ag; Co; Cu; Ni; Sn; differential scanning calorimeter; interfacial eutectic reaction; interfacial reaction; intermetallic compound; melting/solidification characteristics; metallizations; Copper; Heating; Metallization; Nickel; Soldering; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-8140-8
Type :
conf
DOI :
10.1109/ICEPT.2010.5582442
Filename :
5582442
Link To Document :
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