Title :
Systems reliability in Power Electronics: Inherent or beyond reach?
Author :
Mungenast, John E.
Author_Institution :
Power Semicond. Inc., Devon, CT, USA
Abstract :
Many new applications for Power Electronics lie ahead in rapid transit, in new control functions within the AC distribution network and critical energy generation areas.
Keywords :
distribution networks; power electronics; reliability; AC distribution network; energy generation; power electronics; systems reliability; Economics; Integrated circuit reliability; Pain; Power electronics; Redundancy; Solids;
Conference_Titel :
Power Electronics Specialists Conference, 1974 IEEE
Conference_Location :
Murray Hill, NJ
DOI :
10.1109/PESC.1974.7074333