Title :
Techniques to achieve semiconductor reliability in unique power equipment
Author_Institution :
Lawrence Livermore Lab., Univ. of California, Livermore, Livermore, CA, USA
Abstract :
Power semiconductors are opening up vast new areas of electrical engineering which were too complex, or too unreliable, or too costly to be attractive previously. Often the standard semiconductor ratings are not applicable. The paper discusses the design engineers reliability problems and covers one approach to this problem. Design charts for surge networks are included.
Keywords :
power apparatus; power semiconductor devices; semiconductor device reliability; surges; electrical engineering; power equipment; power semiconductor reliability; surge network; Power supplies; Rectifiers; Reliability; Semiconductor diodes; Standards; Surges; Transient analysis;
Conference_Titel :
Power Electronics Specialists Conference, 1974 IEEE
Conference_Location :
Murray Hill, NJ
DOI :
10.1109/PESC.1974.7074336
