Surface Plasmon Resonance (SPR) Effect in Nanoscale Nichrome Alloy Films

Author

Syed, Maarij ; Leibs, Chris ; Siahmakoun, Azad

Author_Institution

Dept. of Phys. & Opt. Eng., Rose-Hulman Inst. of Technol., Terre Haute, IN

fYear

2008

fDate

13-16 July 2008

Firstpage

245

Lastpage

248

Abstract

We have performed surface plasmon resonance (SPR) experiments at 633 nm in the Kretchmann configuration on prisms coated with single metal and Nichrome alloy thin films of ~ 500 Aring. The thin films used in this study are grown by magnetron sputtering, and are binary alloy films (Nickel/Chrome with 80/20 concentration). In addition, for comparison we will also present results for pure metal films (Nickel and Chromium). We have observed a pronounced SPR signal at 633 nm for the Nichrome film while neither of the metal thin films (Ni or Cr) yields an SPR effect. We have grown companion layers of Nichrome, Nickel, and Chromium and investigated their dielectric function in the wavelength range 400 -900 nm. The resulting value of the dielectric function is used to model the reflectance from the prism/metal interface.

Keywords

chromium alloys; nickel alloys; sputtering; surface plasmon resonance; Kretchmann configuration; NiCr; magnetron sputtering; nanoscale nichrome alloy films; surface plasmon resonance; wavelength 400 nm to 900 nm; Chromium alloys; Dielectric thin films; Glass; Nickel; Optical films; Optical surface waves; Plasmons; Reflectivity; Resonance; Sputtering;

fLanguage

English

Publisher

ieee

Conference_Titel

University/Government/Industry Micro/Nano Symposium, 2008. UGIM 2008. 17th Biennial

Conference_Location

Louisville, KY

Print_ISBN

978-1-4244-2484-9

Electronic_ISBN

978-1-4244-2485-6

Type

conf

DOI

10.1109/UGIM.2008.72

Filename

4573250