Title :
A new cad-model of a gate turn-off thyristor
Author_Institution :
R&D Center, Toshiba, Kawasaki, Japan
Abstract :
A new CAD-model of a GTO-thyristor has been developed, including non-linear junction recovery, lateral currents through the conductivity-modulated base layers and external circuit conditions. Computed results give a real time transient response of charges, currents and voltages. A comparison will be made between theoretical and experimental results of a test sample. Agreement is shown to be satisfactory for a quantitative estimation of the actual device characteristics. Further, turn-off time variation due to device parameter fluctuations will be predicted for wide p-base samples.
Keywords :
CAD; semiconductor device models; thyristors; transient response; GTO-thyristor; conductivity-modulated base layers; device parameter fluctuations; external circuit conditions; gate turn-off thyristor; lateral currents; new CAD-model; nonlinear junction recovery; real time transient response; turn-off time variation; wide p-base samples; Abstracts; Cathodes; Lead; Logic gates;
Conference_Titel :
Power Electronics Specialists Conference, 1974 IEEE
Conference_Location :
Murray Hill, NJ
DOI :
10.1109/PESC.1974.7074338