DocumentCode
2274891
Title
Multi-dimensional current flow in silicon power transistors operating in the saturation mode
Author
Sunshine, R.A.
Author_Institution
RCA Labs., Princeton, NJ, USA
fYear
1974
fDate
10-12 June 1974
Firstpage
154
Lastpage
161
Abstract
The current distribution in silicon power transistors operating in the saturation region has been determined by imaging the near-infrared recombination emitted by the transistor. It was found that the overlap diode model for the transistor provides a far better description of the current distribution than the more commonly-used one-dimensional Ebers-Moll model.
Keywords
current distribution; power transistors; semiconductor device models; current distribution; multidimensional current flow; near-infrared recombination; one-dimensional Ebers-Moll model; overlap diode model; saturation region; silicon power transistors; Abstracts; Integrated circuits; Integrated optics; Optical saturation; Probes; Stimulated emission; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1974 IEEE
Conference_Location
Murray Hill, NJ
ISSN
0275-9306
Type
conf
DOI
10.1109/PESC.1974.7074342
Filename
7074342
Link To Document