DocumentCode :
2274920
Title :
Microvessel hyperpermeability and thrombosis induced by light/dye treatment
Author :
Liu, Qin ; Zeng, Min ; Fu, Bingmei M.
Author_Institution :
City Coll. of New York, City Univ. of New York, New York, NY, USA
fYear :
2010
fDate :
26-28 March 2010
Firstpage :
1
Lastpage :
2
Abstract :
To investigate the structural mechanisms by which light/dye treatment induces microvascular hyperpermeability and thrombosis, we quantified thrombus initiation time, thrombus growth rate, and microvessel occlusion time in post-capillary venule of rat mesentery. We also measured the microvessel hydraulic conductivity (Lp) under the same light/dye treatment. With the light intensity of 0.37 mW/mm2, thrombus was initiated in 3.8 ± 0.4 min, with a growth rate 3.9% ± 0.3% of the vessel mid-plane area/min, and microvessels were completely occluded in 29.3 ± 2.2 min (SE, n=8); in 3.5 ± 0.3 min, Lp increased from a mean of 0.98 ± 0.08 to 2.07 ± 0.21 × 10-7 cm/s/cmH2O (SE, n = 11). Lp didn´t increase further after longer time exposure (up to 30 min). Combination of experimental results with predictions from an interendothelial cleft model suggests that the most likely mechanism by which light/dye induces hyperpermeability and thrombosis is degradation of the endothelial glycocalyx layer of the microvessel wall.
Keywords :
biological effects of laser radiation; biomembrane transport; blood vessels; cancer; laser applications in medicine; permeability; photodynamic therapy; endothelial glycocalyx layer degradation; interendothelial cleft model; light-dye treatment; microvessel hydraulic conductivity; microvessel hyperpermeability; microvessel occlusion time; microvessel wall; post-capillary venule; thrombosis; thrombus growth rate; thrombus initiation time; Cardiovascular diseases; Cities and towns; Conductivity measurement; Degradation; Educational institutions; Fluorescence; Permeability measurement; Predictive models; Thrombosis; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bioengineering Conference, Proceedings of the 2010 IEEE 36th Annual Northeast
Conference_Location :
New York, NY
Print_ISBN :
978-1-4244-6879-9
Type :
conf
DOI :
10.1109/NEBC.2010.5458263
Filename :
5458263
Link To Document :
بازگشت