DocumentCode
2274984
Title
Improving the humidity resistance of electronic packaging materials by micro-nano hierarchical structured silica
Author
Zeng, Guangfu ; Gui, Dayong ; Miao, Xin ; Hao, Jingfeng ; Liu, Jianhong
Author_Institution
Sch. of Chem. & Chem. Eng., Shenzhen Univ., Shenzhen, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
170
Lastpage
175
Abstract
Micro-nano structured silica particles were synthesized successfully by grafted 4,4´-diphenylmethane diisocyanate (MDI). We report a robust procedure for preparing superhydrophobic materials with the advancing water contact angle (WCA) of about 155°. Micro-nano structured surface roughness, which mimics the surface topology of self-cleaning plant leaves, originates from well-defined micro-nano structured silica particles that are covalently bonded to an epoxy-based polymer matrix. The roughened surface is chemically modified with a layer of n-octyltriethoxysilane. The morphology of the silica with micro-nano hierarchical structure was observed by SEM. Hierarchical structure of silica filled epoxy resin composite exhibits better humidity resistance than the neat epoxy resin. The results show that the hierarchical structure of silica filled epoxy resin composite is suitable for electronic packaging in humid environment.
Keywords
bonds (chemical); contact angle; electronics packaging; filled polymers; humidity; hydrophobicity; nanocomposites; nanoelectronics; nanoparticles; particle reinforced composites; resins; scanning electron microscopy; silicon compounds; surface morphology; surface roughness; surface treatment; SEM; SiO2; chemically modified surface; covalent bond; electronic packaging materials; epoxy-based polymer matrix; grafted 4,4´-diphenylmethane diisocyanate; humid environment; humidity resistance; micro-nano hierarchical structured silica particles; micro-nano structured surface roughness; morphological properties; n-octyltriethoxysilane layer; robust preparation procedure; scanning electron microscopy; self-cleaning plant leaf surface topology; silica filled epoxy resin composite; superhydrophobic materials; surface roughening; water contact angle; Coatings; Epoxy resins; Rough surfaces; Silicon compounds; Surface morphology; Surface roughness; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582455
Filename
5582455
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