• DocumentCode
    2274984
  • Title

    Improving the humidity resistance of electronic packaging materials by micro-nano hierarchical structured silica

  • Author

    Zeng, Guangfu ; Gui, Dayong ; Miao, Xin ; Hao, Jingfeng ; Liu, Jianhong

  • Author_Institution
    Sch. of Chem. & Chem. Eng., Shenzhen Univ., Shenzhen, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    170
  • Lastpage
    175
  • Abstract
    Micro-nano structured silica particles were synthesized successfully by grafted 4,4´-diphenylmethane diisocyanate (MDI). We report a robust procedure for preparing superhydrophobic materials with the advancing water contact angle (WCA) of about 155°. Micro-nano structured surface roughness, which mimics the surface topology of self-cleaning plant leaves, originates from well-defined micro-nano structured silica particles that are covalently bonded to an epoxy-based polymer matrix. The roughened surface is chemically modified with a layer of n-octyltriethoxysilane. The morphology of the silica with micro-nano hierarchical structure was observed by SEM. Hierarchical structure of silica filled epoxy resin composite exhibits better humidity resistance than the neat epoxy resin. The results show that the hierarchical structure of silica filled epoxy resin composite is suitable for electronic packaging in humid environment.
  • Keywords
    bonds (chemical); contact angle; electronics packaging; filled polymers; humidity; hydrophobicity; nanocomposites; nanoelectronics; nanoparticles; particle reinforced composites; resins; scanning electron microscopy; silicon compounds; surface morphology; surface roughness; surface treatment; SEM; SiO2; chemically modified surface; covalent bond; electronic packaging materials; epoxy-based polymer matrix; grafted 4,4´-diphenylmethane diisocyanate; humid environment; humidity resistance; micro-nano hierarchical structured silica particles; micro-nano structured surface roughness; morphological properties; n-octyltriethoxysilane layer; robust preparation procedure; scanning electron microscopy; self-cleaning plant leaf surface topology; silica filled epoxy resin composite; superhydrophobic materials; surface roughening; water contact angle; Coatings; Epoxy resins; Rough surfaces; Silicon compounds; Surface morphology; Surface roughness; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582455
  • Filename
    5582455