Test pattern compression based on pattern overlapping and broadcasting

The high test data volume and long test application time are two major concerns for testing scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This paper will illustrate that these new techniques are effective in both the test application time and the test data volume reduction.