• DocumentCode
    2275093
  • Title

    Development of green molding compound for high voltage discrete package

  • Author

    Xie, Guangchao ; Ruan, Jianhua ; Wang, Yue ; Du, Xinyu ; Cheng, Xingming

  • Author_Institution
    Henkel Huawei Electron. Co., Ltd., Lianyungang, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    148
  • Lastpage
    151
  • Abstract
    The market demand of discrete is very big in semiconductor package. A lot of discrete package is transferring to green compound which are surface mounting design and high voltage power application. It must pass the relative electrical performance and standard JEDEC Level testing. Currently green molding compound always meet some H(3)TRB failure on high voltage device and delamination issue after MSL1 precondition with lead free soldering condition. It becomes a challenge for molding compound supplier to design suitable green material to satisfy both reliability and moldability test. In this study, the failure mode of HTRB was discussed and some key raw materials were tested in formulation to understand different raw material effect on HTRB performance. The adhesion to lead frame was measured to show different material effect on interfacial adhesion strength. All materials were molded on SOT23 test vehicle and subject to HTRB and Standard JEDEC Level testing. The long term moldability was also tested in this study. It was found with certain material had good HTRB result on SOT package with high voltage application.
  • Keywords
    semiconductor device packaging; semiconductor device reliability; semiconductor device testing; soldering; HTRB performance; MSL1 precondition; SOT package; SOT23 test vehicle; green molding compound; high voltage discrete package; high voltage power application; interfacial adhesion strength; lead free soldering condition; moldability test; raw material effect; relative electrical performance; reliability test; semiconductor package; standard JEDEC level testing; surface mounting design; Adhesives; Copper; Delamination; Silicon compounds; Stress; Delamination; Discrete; EMC; HTRB; Moldability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582460
  • Filename
    5582460