DocumentCode :
2275328
Title :
Algorithm for pupillometric data analysis
Author :
Canver, Matthew C. ; Canver, Adam C. ; Revere, Karen E. ; Amado, Defne ; Bennett, Jean ; Chung, Daniel C.
Author_Institution :
Dept. of Bioeng., Univ. of Pennsylvania, Philadelphia, PA, USA
fYear :
2010
fDate :
26-28 March 2010
Firstpage :
1
Lastpage :
2
Abstract :
Pupillometry is used clinically to evaluate retinal and optic nerve health by measuring pupillary function in response to light stimuli. We have developed an algorithm using murine pupillometric measurements to automate the analysis of pupillometric data. The raw data is filtered and thresholding is used to remove data caused by eye blinking, loss of pupil tracking, and/or head movement. Twelve physiologically relevant parameters are extracted from the collected data. Algorithm derived values do not deviate significantly from the manually calculated parameters (p ¿ 0.05). This algorithm can be used to establish normative values of pupillary light responses for humans, as well as wild-type and transgenic mouse strains, which can subsequently be used as reference metrics for characterizing the retinal phenotype of retinal disease. Furthermore, it will be instrumental in the assessment of functional visual recovery in humans and pre-clinical models of retinal degeneration and optic nerve disease following pharmacological or gene-based therapies.
Keywords :
bio-optics; biomedical measurement; eye; medical computing; vision defects; eye blinking; functional visual recovery; gene-based therapy; head movement; humans; murine pupillometric measurements; optic nerve disease; pharmacological therapy; pupil tracking; pupillary light responses; pupillometric data analysis; retinal degeneration; retinal disease; retinal nerve; retinal phenotype; transgenic mouse strains; Algorithm design and analysis; Data analysis; Data mining; Degenerative diseases; Humans; Mice; Optical filters; Optical losses; Retina; Tracking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bioengineering Conference, Proceedings of the 2010 IEEE 36th Annual Northeast
Conference_Location :
New York, NY
Print_ISBN :
978-1-4244-6879-9
Type :
conf
DOI :
10.1109/NEBC.2010.5458283
Filename :
5458283
Link To Document :
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