Title :
EMI induced by the simultaneous switching noise on the partitioned DC planes
Author :
Hwang, J.N. ; Lin, J.J. ; Wu, Tzong-Lin
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
Based on the FDTD modelling approach, the bridging effect of the isolation moat on the EMI caused by simultaneous switching noise is investigated. We find that isolating the noise source by the slits (or moats) is effective to eliminate the EMI, but bridges connecting between two sides of the slits will significantly degrade the effect of EMI protection. The measured and modelled results of the EMI strength at 3m are compared and they are quite consistent
Keywords :
circuit noise; electromagnetic interference; finite difference time-domain analysis; EMI; FDTD model; bridging effect; isolation moat; partitioned DC plane; simultaneous switching noise; slit; Bridge circuits; Circuit noise; Digital circuits; Electromagnetic compatibility; Electromagnetic interference; Finite difference methods; Joining processes; Power measurement; Resonant frequency; Time domain analysis;
Conference_Titel :
Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific
Conference_Location :
Taipei
Print_ISBN :
0-7803-7138-0
DOI :
10.1109/APMC.2001.985332
