• DocumentCode
    2275410
  • Title

    A simple setup to test thermal contact resistance between interfaces of two contacted solid materials

  • Author

    Liu, Ju ; Feng, Han ; Luo, Xiaobing ; Hu, Run ; Liu, Sheng

  • Author_Institution
    Sch. of Energy & Power Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    116
  • Lastpage
    120
  • Abstract
    An experimental setup to measure the thermal contact conductance across solid/solid interface is described in this paper. This setup was built at room temperature, it does not need vacuum environment and can be used in normal pressure environment. An experimental investigation of thermal contact resistance of two brass columns was conducted under different conditions, which were classified as four major aspects, including the interfacial pressure, the voltage of heater, environmental temperature compensation and thermal conductive adhesive. The effects of these four conditions on the thermal contact resistance were investigated and the results show that thermal contact resistance decreases with the increase of interfacial pressure, thermal contact resistance almost does not change with the increase of input voltage of heater, and the thermal contact resistance for the experiments with temperature compensation is lower than that without temperature compensation. Moreover, the thermal contact resistance measured by experiment with thermal conductive adhesive at the interface is lower than that the one without thermal conductive adhesive. Analyses of the experimental results were presented and explanations to the effects were given after the analyses.
  • Keywords
    brass; conductive adhesives; thermal conductivity; Cu-Zn; brass columns; contacted solid materials; environmental temperature compensation; heater voltage; interfacial pressure; normal pressure environment; thermal conductive adhesive; thermal contact conductance; thermal contact resistance; Conductive adhesives; Contact resistance; Resistance heating; Temperature measurement; Thermal conductivity; Thermal resistance; Interface; Setup; Thermal contact resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582472
  • Filename
    5582472