DocumentCode :
2275501
Title :
A novel MOSFET structure with asymmetric Schottky and P-N junction source/drain on bulk silicon substrate
Author :
Xu, Peng ; Hu, Cheng ; Chen, Mei-Gui ; Zhu, Zhiwei ; Zhang, David Wei ; Wu, Dongping
Author_Institution :
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
fYear :
2012
fDate :
14-15 May 2012
Firstpage :
238
Lastpage :
241
Abstract :
An asymmetric Schottky and P-N junction source/drain MOSFET contains a conventional P-N junction and a hybrid junction for the source and drain or vice versa. Owing to the asymmetric source/drain structure, this device could be used in two different situations: Schottky-junction source MOSFETs and Schottky-junction drain MOSFETs. Performances of MOSFETs featuring a gate length of 100 nm with Schottky-junction source, Schottky-junction drain, Schottky-junction source/drain and conventional P-N junction have been obtained via numerical simulation by using Silvaco software package. The Schottky-junction source MOSFET exhibits significantly lower GIDL leakage current compared with the pure Schottky-barrier MOSFETs and slightly lower drive current compared with conventional P-N junction MOSFETs when the Schottky barrier height is set at 0.13 eV. For the Schottky-junction drain MOSFET, its drive current is found to be similar to that of conventional P-N junction MOSFETs and less sensitive to variations of Schottky barrier height compared with pure Schottky-barrier MOSFET.
Keywords :
MOSFET; Schottky barriers; elemental semiconductors; leakage currents; numerical analysis; p-n junctions; silicon; GTDL leakage current; MOSFET structure; P-N junction source-drain MOSFET; Schottky barrier height; Schottky junction drain MOSFET; Schottky junction source MOSFET; Si; Silvaco software package; asymmetric Schottky junction source-drain MOSFET; asymmetric source-drain structure; bulk silicon substrate; electron volt energy 0.13 eV; hybrid junction; numerical simulation; Abstracts; Junctions; Logic gates; MOSFET circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Junction Technology (IWJT), 2012 12th International Workshop on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-1258-5
Electronic_ISBN :
978-1-4673-1256-1
Type :
conf
DOI :
10.1109/IWJT.2012.6212849
Filename :
6212849
Link To Document :
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