DocumentCode :
2275521
Title :
Automatic generation of test data for path testing by adaptive genetic simulated annealing algorithm
Author :
Zhang, Bo ; Wang, Chen
Author_Institution :
Dept. of Fire Eng., Chinese People´´s Armed Police Forced Acad., Langfang, China
Volume :
2
fYear :
2011
fDate :
10-12 June 2011
Firstpage :
38
Lastpage :
42
Abstract :
Software testing has become an important stage of the software developing process in recent years, and it is crucial element of software quality assurance. Path testing has become one of the most important unit test methods, and it is a typical white box test. The generation of testing data is one of the key steps which have a great effect on the automation of software testing. GA is adaptive heuristic search algorithm premised on the evolutionary ideas of natural selection and genetic. Because it is a robust search method requiring little information to search effectively in a large or poorly-understood search space, it is widely used to search and optimize, and also can be used to generate test data. In this article we put the anneal mechanism of the Simulated Anneal Algorithm into the genetic algorithm to decide to accept the new individuals or not, and we import dynamic selections to adaptive select individuals which can be copied to next generation. Adaptive crossover probability, adaptive mutation probability and elitist preservation ensure that the best individuals can not be destroyed. The experiment results show that adaptive genetic simulated annealing algorithm is superior to genetic algorithm in effectiveness and efficiency.
Keywords :
genetic algorithms; probability; program testing; search problems; simulated annealing; software quality; adaptive crossover probability; adaptive genetic simulated annealing algorithm; adaptive heuristic search algorithm; adaptive mutation probability; automatic test data generation; dynamic selection; elitist preservation; path testing; robust search method; software developing process; software quality assurance; software testing; unit test method; white box test; AGSAA; GA; path test; test data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Automation Engineering (CSAE), 2011 IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-8727-1
Type :
conf
DOI :
10.1109/CSAE.2011.5952418
Filename :
5952418
Link To Document :
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